发明名称 Method and apparatus for direct formation of nanometer scaled features
摘要 An apparatus and use of the apparatus to form nanometer sized features on a workpiece includes a plurality of individually biasable tips, and each tip has a diameter on the scale or 10 nm or less. By moving the tips above the surface of a workpiece in the presence of reactants, features can be directly formed on the workpiece on a sub-micron size, below the resolution of current photolithography. The features may be etched into a workpiece, or formed thereover.
申请公布号 US9466500(B2) 申请公布日期 2016.10.11
申请号 US201414487356 申请日期 2014.09.16
申请人 APPLIED MATERIALS, INC. 发明人 Mack James Francis;Moffatt Stephen
分类号 H01B13/00;H01L21/306;C23C16/455;H01J37/32;H01L21/02;H01L21/762;H01L21/768;H01L21/3065;H01L21/67;H01L21/68;H01L21/285;C23C16/04 主分类号 H01B13/00
代理机构 Patterson & Sheridan, LLP 代理人 Patterson & Sheridan, LLP
主权项 1. A method of forming a tip plate useful for the direct formation of features on a workpiece, comprising; providing a substrate; forming a plurality of interconnects terminating therein; forming a plurality of transistors on or in the substrate, and connecting a source or drain of a transistor of the plurality of transistors to an interconnect of the plurality of interconnects; and pattern etching the substrates to form tips having an alignment such that an individual tip is formed over each interconnect.
地址 Santa Clara CA US