发明名称 SEMICONDUCTOR ELEMENT MANUFACTURING METHOD AND PLASMA ETCHING DEVICE USED FOR MANUFACTURING OF SEMICONDUCTOR ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor element manufacturing method and a plasma etching device, which can inhibit non-uniform etching.SOLUTION: A semiconductor element manufacturing method of the present embodiment comprises a first etching step and a second etching step. In the first etching step, an etching gas is supplied to the inside of a plasma generation space to produce plasma; and first power is applied to a base 51 to etch a semiconductor substrate K. In the second etching step, second power lower than the first power is applied to the base after the first etching step to etch the semiconductor substrate K. In addition, in the second etching step, a diluent gas is supplied to a circumference of the semiconductor substrate K by a dilution device 8.SELECTED DRAWING: Figure 1
申请公布号 JP2016189374(A) 申请公布日期 2016.11.04
申请号 JP20150068146 申请日期 2015.03.30
申请人 SPP TECHNOLOGIES CO LTD 发明人 SASAKURA MASAHIRO;OTA KAZUYA;YAMAMOTO TAKASHI;HAYASHI YASUYUKI
分类号 H01L21/3065;H05H1/46 主分类号 H01L21/3065
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