| 摘要 |
PURPOSE:To reduce remarkably a necessary man-hour, and also to scarcely cause an artificial error by generating automatically a test data for testing a package which becomes a test object, by an in-circuit tester. CONSTITUTION:A central processing unit CPU extracts successively circuit elements stored in a circuit element information file EF, for instance, resistance R1 to R3, a capacitor C and a diode D. The corresponding specifications are extracted from a circuit element library EL. Also, pin terminal numbers connected directly to each circuit element from a circuit pattern information file CF and a pin terminal information file PF, for instance, (a) to (f) are identified, edited by a form prescribed in advance as a test data of an in-circuit tester together with the specifications, and stored temporarily in a main storage device MM. Said number is punched in a paper tape by a paper tape punch PT and outputted. |
