发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 A semiconductor memory device includes a first fuse set block including a fuse array for storing first repair information, and a control block configured to store second repair information in a first mode, and generate an output control signal when input addresses applied from an external source and the second repair information are the same, in a second mode, wherein the first fuse set block enables a first match signal for accessing a first redundancy memory cell when the stored first repair information and the input addresses are the same, and disables the first match signal in response to the output control signal.
申请公布号 US2016300627(A1) 申请公布日期 2016.10.13
申请号 US201514855071 申请日期 2015.09.15
申请人 SK hynix Inc. 发明人 YOU Jung-Taek;CHOI Byeong-Chan
分类号 G11C29/00;G11C17/16;G11C8/18;G11C5/14;G11C8/06;G11C8/12 主分类号 G11C29/00
代理机构 代理人
主权项 1. A semiconductor memory device comprising: a first fuse set block including a fuse array for storing first repair information; and a control block suitable for storing second repair information in a first mode, and generating an output control signal when input addresses applied from an external source and the second repair information are the same, in a second mode, wherein the first fuse set block enables a first match signal for accessing a first redundancy memory cell when the stored first repair information and the input addresses are the same, and disables the first match signal in response to the output control signal.
地址 Gyeonggi-do KR