发明名称 |
METHOD OF FABRICATING A SEMICONDUCTOR DEVICE |
摘要 |
<p>METHOD OF FABRICATING A SEMICONDUCTOR DEVICE A method for making a MOSFET device (20) in a semiconductor body (10) includes forming source and drain contact electrodes (12.1, 12.2) prior to growth of the gate oxide (10.3) and after formation of a high conductivity surface region. The exposed mutually opposing sidewall edges of each of the contact electrodes (12.1, 12.2) are coated with a sidewall silicon dioxide layer (15. 1, 15.2), and the exposed surface of the semiconductor body (10) between these sidewalls is then etched to separate the high conductivity surface region into the source and drain regions (10.1, 10.2). Formation and etching of the high conductivity region may be omitted by using Schottky barrier or impurity doped material for the contact electrodes (12.1, 12.2).</p> |
申请公布号 |
CA1179787(A) |
申请公布日期 |
1984.12.18 |
申请号 |
CA19810389861 |
申请日期 |
1981.11.12 |
申请人 |
WESTERN ELECTRIC COMPANY, INCORPORATED |
发明人 |
CHANG, CHUAN C.;COOPER, JAMES A., JR.;KAHNG, DAWON;MURARKA, SHYAM P. |
分类号 |
H01L21/285;H01L21/336;H01L29/423;H01L29/78;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/285 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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