| 摘要 |
PURPOSE:To prevent the IC erroneous selection of an auto handler by comparison of whether non-defect and defect signals of an IC tester are inputted to the input circuit of the auto handler as normal signals. CONSTITUTION:The non-defect signal 100a of the IC tester and the non-defect signal and the defect signal 100b and 200b of the auto handler 200a are inputted to ''or else'' circuits 400a and 400b of a coincidence circuit unit 400, and whether the non-defect or defect signals of each other are of the same waveform is compared. When the non-defect or the defect signal are of the same waveform, the output of the ''or else'' circuit 400a or 400b becomes the input of flip flop circuits 400c and 400d and is then set at the timing synchronized by the test-finish signal 100c of the IC tester; thereafter the same output signals become the inputs of a logical circuit 400e, respectively, generates a gap signal when logical sum is taken, and then stop the action of an lC automatic inspection device forcibly. |
