INSPECTION METHOD OF MEMORY IC,申请号JP19840193567-传众专利搜索

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发明名称	INSPECTION METHOD OF MEMORY IC
摘要
申请公布号	JPS6171500(A)	申请公布日期	1986.04.12
申请号	JP19840193567	申请日期	1984.09.14
申请人	SHARP CORP	发明人	SOYAMA TADASHI;YAZAKI TAKESHI
分类号	G11C29/00;G11C29/56;H01L21/66;H01L21/822;H01L27/04	主分类号	G11C29/00
代理机构		代理人
主权项
地址

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