发明名称 SOLUTION SAMPLING APPARATUS
摘要 PURPOSE:To make it possible to continuously measure the temp. of matte by easily sampling only the matte flowing along the lower side of a solution, by providing a siphon which is opened to the bottom part of the channel demarcated by a trough permitting the solution to flow and of which the other end opening part is positioned along the lateral side of the trough. CONSTITUTION:A solution sampling apparatus 2 is provided between the melting furnace and separation furnace of a continuous copper-making furnace and equipped with a trough 12. A siphon 21 which is opened to the bottom part of the channel demarcated by the trough 12 and of which the other end opening part is positioned along the lateral side of the trough 12 is provided. A slag layer S is formed to the upper side in the trough 12 and a matte layer M is formed to the lower side and a mixed layer C is present between both layers. Only the matte layer M is present in the siphon 21 and the temp. only of the matte layer M is continuously measured by a thermometer 22. This separated matte can be easily sampled and analysis can be performed with respect to the matte discharged from the melting furnace an early stage with good accuracy.
申请公布号 JPS62238459(A) 申请公布日期 1987.10.19
申请号 JP19860083108 申请日期 1986.04.10
申请人 MITSUBISHI METAL CORP 发明人 IKOMA HIROAKI;IIDA OSAMU
分类号 G01N33/20;C22B9/00;C22B15/00;F27D21/00;F27D99/00;G01N1/10 主分类号 G01N33/20
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