发明名称 MARK SIGNAL PROCESSOR USING CHARGED PARTICLE BEAM
摘要 PURPOSE:To reduce the wear of a mask due to beam irradiation, by eliminating back ground level from a signal obtained by detecting a reflected beam, and finding a mark position on the basis of the signal in which noise component is eliminated and smoothing is done. CONSTITUTION:Charged particle beam Bi is radiated on a mask 4, generated reflection beam is received, and a signal including back ground level and noise component is output from a beam detector 5. A signal waveform resulting from elimination of the unnecessary ground component independent of the signal component can be obtained by a subtractor 6. Then the output of the subtractor 6 is input to a filter 9, and the elimination of noise and the smoothing of waveform are performed. After a trial function which best approximates a signal to the signal subjected to smoothing is obtained by a fitting circuit 10, center coodinates of the trial function are calculated by the next peak center determination circuit 11. Thus a very accurate trial function can be determined, so that a mark position is accurately obtained. Further the number of times of averaging by integrating can be extermely reduced.
申请公布号 JPS63102231(A) 申请公布日期 1988.05.07
申请号 JP19860248051 申请日期 1986.10.17
申请人 JEOL LTD 发明人 NAKANODA SHINJI
分类号 H01L21/30;H01L21/027;H01L21/68 主分类号 H01L21/30
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