发明名称 PLATE THICKNESS CONTROLLER FOR ROLLING MILL
摘要 <p>PURPOSE:To properly perform the control of a plate thickness and the control of a controlling gain by finding an influence coefft. from the frequency analyzing result of various factors signals causing the disturbance effected on the plate thickness deviation at an outlet side and the frequency analysis result of the plate thickness deviation signal at the outlet side. CONSTITUTION:Frequency analyzers 4A, 4B performs the frequency analysis of the plate thickness deviations H, h detected by an outlet side thickness gage 2 and inlet side thickness gage 1 and a variable band-pass filter 5 performs a frequency filtering. An AGC device 10 controls a rolling reduction controller 11 based on the correction gains of the analyzer 4A, rolling reduction amt., and detection amt. (h). A parameter correction device 6 performs the correction of various parameters. This correction parameter is used for a model identifica tion by a model identification device 7 to offer for the correction of a gain correction device 9. The device 9 receives a model from a control system model 8. The outlet side thickness (h) is caused by the disturbance H, S, Pm( Pu), Pk of four kinds.</p>
申请公布号 JPS63160712(A) 申请公布日期 1988.07.04
申请号 JP19860306368 申请日期 1986.12.24
申请人 HITACHI LTD 发明人 MATSUI YOICHI
分类号 B21B37/18 主分类号 B21B37/18
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