发明名称 Method of treating photoresists.
摘要 <p>Ultraviolet radiation process applies to manufacture semiconductor devices in order to enhance the thermal stability of the photoresist film on semiconductor wafers. A method, in ultraviolet radiation process, enabling effective treatment of the developed positive photoresist image employing ultraviolet irradiation by preventing the deformation of the developed positive photoresist image which is caused by exposing it to high ultraviolet radiation at the beginning of exposure. This method employs ultraviolet irradiation, in which the developed positive photoresist image placed in gas of a lower atmospheric pressure is exposed to ultraviolet radiation of low intensity at the beginning of exposure, and then exposed to ultraviolet radiation, the intensity of which increases little by little or in steps.</p>
申请公布号 EP0283665(A2) 申请公布日期 1988.09.28
申请号 EP19880101170 申请日期 1988.01.27
申请人 USHIO ELECTRIC INC 发明人 SUZUKI, SHINJI C/O USHIO DENKI;UEKI, KAZUYOSHI C/O USHIO DENKI;SUZUKI, HIROKO C/O USHIO DENKI;MIMURA, YOSHIKI C/O USHIO DENKI
分类号 G03F7/40;G03C5/00;G03F7/00;G03F7/20;H01L21/027;H01L21/30;(IPC1-7):G03F7/26 主分类号 G03F7/40
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