发明名称 Distribution of gas over a semiconductor wafer in batch processing
摘要 A method and apparatus to evenly distribute gas over a wafer in batch processing. Several techniques are disclosed, such as, but not limited to, angling an injector to distribute gas towards a proximate edge of the wafer, and/or reducing the amount of overlap in the center of the wafer of gas from subsequent gas injections.
申请公布号 US9493874(B2) 申请公布日期 2016.11.15
申请号 US201213678025 申请日期 2012.11.15
申请人 CYPRESS SEMICONDUCTOR CORPORATION 发明人 Sugino Rinji
分类号 C23C16/455;C23C16/458;H01L21/673 主分类号 C23C16/455
代理机构 代理人
主权项 1. An apparatus for injecting gas onto a wafer, the apparatus comprising: an arrangement comprising a plurality of wafers configured for batch processing; a plurality of injectors, wherein an outlet of each injector of the plurality of injectors is aligned with a plane of a corresponding wafer of the plurality of wafers and is configured to direct a corresponding portion of a gas substantially parallel to the plane of the corresponding wafer; and a plurality of rectification wings, wherein: each pair of rectification wings from among the plurality of rectification wings is coupled to a corresponding injector of the plurality of injectors and is configured to deflect the corresponding portion of the gas away from a center of the corresponding wafer;at least one rectification wing from among the plurality of rectification wings extends along the plane of the corresponding wafer and overlaps at least a portion of the corresponding wafer; andthe outlet of each injector of the plurality of injectors is interposed between a corresponding pair of rectification wings from among the plurality of rectification wings.
地址 San Jose CA US