DEVICE FOR TESTING PRINTED CIRCUIT BOARDS WITH A GRID OF CONTACT POINTS OF ELEVATED DENSITY

摘要

1. Electronic device for testing printed circuit boards with a contact point grid (basic matrix/output matrix) for receiving the test probes of an adapter (custom adapter) to connect the test points of the printed circuit board to be tested to the contact points which are arranged according to a Cartesian coordinate system (X, Y) with a contact point spacing of a = 1/10 inch = 2.54 mm in the direction of both coordinate axes, characterised in that a further identical contact point grid is superimposed on this contact point grid, and is displaced 0.5 a in the direction of both coordinate axes with respect to the output grid.