发明名称 HIGH DENSITY PACKAGE INTERCONNECTS
摘要 Electronic assemblies and methods including the formation of interconnect structures are described. In one embodiment an apparatus includes semiconductor die and a first metal bump on the die, the first metal bump including a surface having a first part and a second part. The apparatus also includes a solder resistant coating covering the first part of the surface and leaving the second part of the surface uncovered. Other embodiments are described and claimed.
申请公布号 US2016284635(A1) 申请公布日期 2016.09.29
申请号 US201615174921 申请日期 2016.06.06
申请人 INTEL CORPORATION 发明人 GANESAN Sanka;QIAN Zhiguo;SANKMAN Robert L.;SRINIVASAN Krishna;ZHU Zhaohui
分类号 H01L23/498;H01L23/00;H01L23/50 主分类号 H01L23/498
代理机构 代理人
主权项
地址 Santa Clara CA US