发明名称 Method for producing semiconductor device having alignment mark.
摘要 <p>An alignment method for a semiconductor device having a conductive thin film (9) on a conductive substrate surface across an insulation film (4), comprises steps of: forming in the insulation film, at least two apertures (5,6) exposing the substrate surface therein; selectively depositing a conductive material (7,8) in the apertures thereby forming a stepped portion in at least one of said apertures; and forming the conductive thin film (9) at least on said insulation film. The alignment is conducted utilizing the stepped portion. <IMAGE></p>
申请公布号 EP0465152(A2) 申请公布日期 1992.01.08
申请号 EP19910305871 申请日期 1991.06.28
申请人 CANON KABUSHIKI KAISHA 发明人 OKABE, TAKAHIKO;MONMA, GENZO;YUZURIHARA, HIROSHI
分类号 H01L23/544 主分类号 H01L23/544
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