发明名称 |
Etch-resistant pattern formation on substrate - by formation of photoresist layer on carrier substrate, formation of pattern in photoresist layer, lamination onto receiving substrate, etc. |
摘要 |
Formation of an etch-resistant pattern on a substrate comprises a) formation of a photoresist layer on a flat, transparent carrier substrate; b) formation of a photoresist pattern in the photoresist layer; c) lamination of the photoresist pattern carrier substrate onto a receiving substrate using a curable liq. adhesive between both substrates, where the photoresist side lies opposite the receiving substrate side, d) hardening of the liq. adhesive by heating or pref. by actinic photo-irradiation and removal of the carrier substrate for transfer of the photoresist pattern onto the receiving substrate, and e) dry-development of the pattern transferred from the carrier substrate by oxygen plasma- or oxygen reactive ion etching on the receiving substrate. USE/ADVANTAGE - Useful for formation of micropatterns and for prodn. of integrated switching circuits. Sufficient pattern reproduction is realised with simple good reproduction with minimisation of the influence of substrate topography.
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申请公布号 |
DE4029609(A1) |
申请公布日期 |
1992.04.02 |
申请号 |
DE19904029609 |
申请日期 |
1990.09.19 |
申请人 |
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, CHUTUNG, HSING-CHU, TW |
发明人 |
LIN, DHEI-JHAI, TAOYUAN, TW |
分类号 |
G03F7/34 |
主分类号 |
G03F7/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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