发明名称 Etch-resistant pattern formation on substrate - by formation of photoresist layer on carrier substrate, formation of pattern in photoresist layer, lamination onto receiving substrate, etc.
摘要 Formation of an etch-resistant pattern on a substrate comprises a) formation of a photoresist layer on a flat, transparent carrier substrate; b) formation of a photoresist pattern in the photoresist layer; c) lamination of the photoresist pattern carrier substrate onto a receiving substrate using a curable liq. adhesive between both substrates, where the photoresist side lies opposite the receiving substrate side, d) hardening of the liq. adhesive by heating or pref. by actinic photo-irradiation and removal of the carrier substrate for transfer of the photoresist pattern onto the receiving substrate, and e) dry-development of the pattern transferred from the carrier substrate by oxygen plasma- or oxygen reactive ion etching on the receiving substrate. USE/ADVANTAGE - Useful for formation of micropatterns and for prodn. of integrated switching circuits. Sufficient pattern reproduction is realised with simple good reproduction with minimisation of the influence of substrate topography.
申请公布号 DE4029609(A1) 申请公布日期 1992.04.02
申请号 DE19904029609 申请日期 1990.09.19
申请人 INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, CHUTUNG, HSING-CHU, TW 发明人 LIN, DHEI-JHAI, TAOYUAN, TW
分类号 G03F7/34 主分类号 G03F7/34
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