发明名称 SENSITIVITY CORRECTION OF DETECTING ELEMENT AND X-RAY DETECTION DEVICE
摘要 PURPOSE:To enable early discovery of abnormality by making a calculation part obtain sensitivity correction coefficient in advance and making a memory part store the coefficient, and by comparing the stored sensitivity correction coefficient to new sensitivity correction coefficient which is measured prior to commencement of the measurement. CONSTITUTION:Average value AVS is recalculated, excluding elements that are substantially different correction coefficient strored in a memory element part 6 and are recognized as abnormality detection elements. From this AVS, correction coefficient for each detection element CnHs, is calculated. Those coefficients are made to be stored and a detection object is placed and then measurement is conducted. In case that the first element is the abnormality detection element, an average value of the second and the third ones is taken, and, in case that the 512th element is the abnormality detection element, an average value of the 510th and the 511th ones is taken, in order to conduct interpolation treatment. By the process said above, accurate measurement can be executed even in case that abnormality exists at the detection element.
申请公布号 JPH04203995(A) 申请公布日期 1992.07.24
申请号 JP19900333955 申请日期 1990.11.29
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 OOTSUCHI TETSUO;OOMORI YASUICHI;BABA MATSUKI;TSUTSUI HIROSHI
分类号 G01T1/24;A61B6/03;G01N23/08;G01T7/00 主分类号 G01T1/24
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