发明名称 METHOD AND DEVICE FOR INSPECTION USING INK-JET METHOD
摘要 PROBLEM TO BE SOLVED: To provide a method and a device for inspection using an ink-jet method that can inspect more than one sample rapidly, sensitively, and accurately even when the samples are present in small amounts.SOLUTION: The method for inspection using an ink-jet method according to the present application includes a first step of applying a first solution containing a subject of the inspection on a substrate by discharging the solution by an ink-jet method and a second step of applying a second solution containing an antibody to the substrate by discharging the solution by the ink-jet method, the first and second solutions being applied to the same spot of the substrate and the antibody and the subject being reacted on the substrate to determine the quantity of the subject.SELECTED DRAWING: None
申请公布号 JP2016169957(A) 申请公布日期 2016.09.23
申请号 JP20150048043 申请日期 2015.03.11
申请人 SEIKO EPSON CORP 发明人 YATAKE MASAHIRO
分类号 G01N33/53 主分类号 G01N33/53
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