发明名称 Semiconductor element and semiconductor memory device using the same.
摘要 <p>A field-effect semiconductor element implemented with a fewer number of elements and a reduced area and capable of storing data by itself without need for cooling at a cryogenic temperature, and a memory device employing the same. Gate-channel capacitance (Cgc) is set so small that whether or not a trap (7) captures one electron or hole can definitely and distinctively be detected in terms of changes of a current of the semiconductor FET element. By detecting a change in a threshold voltage of the semiconductor element brought about by trapping of electron or hole in the trap, data storage can be realized at a room temperature. &lt;IMAGE&gt; &lt;IMAGE&gt;</p>
申请公布号 EP0642173(A1) 申请公布日期 1995.03.08
申请号 EP19940112656 申请日期 1994.08.12
申请人 HITACHI, LTD. 发明人 YANO, KAZUO;ISHII, TOMOYUKI;HASHIMOTO, TAKASHI;SEKI, KOICHI;AOKI, MASAKAZU;SAKATA, TAKESHI, LA KABINA DE AMICHI 301;NAKAGOME, YOSHINOBU;TAKEUCHI, KAN
分类号 H01L21/8247;G11C11/22;G11C11/404;G11C16/02;G11C16/04;G11C16/28;H01L21/28;H01L21/336;H01L27/01;H01L27/115;H01L29/423;H01L29/51;H01L29/66;H01L29/76;H01L29/788;H01L29/792;H01L29/94;H01L31/036;H01L31/062;H01L31/112;H01L31/113;(IPC1-7):H01L29/792;G11C11/401 主分类号 H01L21/8247
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