发明名称 |
Circuit and method for real-time monitoring of process, temperature, and voltage variations |
摘要 |
The present disclosure provides a monitoring system for monitoring the operation of an integrated circuit, the monitoring system comprising: a reference circuit comprising a reference signal delay path and an output for outputting a reference signal; a monitoring circuit, the monitoring circuit comprising: a programmable delay line for providing a controllably selectable delay path; and an output for outputting a delayed signal; a comparison circuit, for comparing the reference signal to the delayed signal and determining whether the error has occurred based on the comparison. |
申请公布号 |
US9459314(B1) |
申请公布日期 |
2016.10.04 |
申请号 |
US201414510005 |
申请日期 |
2014.10.08 |
申请人 |
Microsemi Storage Solutions (U.S.), Inc. |
发明人 |
Chang Howard Shih Hao |
分类号 |
H03B19/00;G01R27/26;G01R31/28;H03K5/14 |
主分类号 |
H03B19/00 |
代理机构 |
Letters Patent, LLC |
代理人 |
Letters Patent, LLC ;Haszko Dennis R. |
主权项 |
1. A monitoring system for monitoring the operation of an integrated circuit, the monitoring system comprising:
a reference circuit comprising a first register and a first inverter coupled in a first feedback loop to provide a reference signal delay path having a first setup margin, and an output for outputting a reference signal; a monitoring circuit, the monitoring circuit comprising:
a second register;a second inverter;a programmable delay line;wherein the second register, the programmable delay line, and the second inverter are coupled in a feedback loop to provide a controllably selectable delay path having a controllably selectable second setup margin; andan output for outputting a delayed signal; and a comparison circuit, for comparing the output reference signal to the output delayed signal and determining whether a time setup error has occurred based on the comparison. |
地址 |
Aliso Viejo CA US |