发明名称 Circuit and method for real-time monitoring of process, temperature, and voltage variations
摘要 The present disclosure provides a monitoring system for monitoring the operation of an integrated circuit, the monitoring system comprising: a reference circuit comprising a reference signal delay path and an output for outputting a reference signal; a monitoring circuit, the monitoring circuit comprising: a programmable delay line for providing a controllably selectable delay path; and an output for outputting a delayed signal; a comparison circuit, for comparing the reference signal to the delayed signal and determining whether the error has occurred based on the comparison.
申请公布号 US9459314(B1) 申请公布日期 2016.10.04
申请号 US201414510005 申请日期 2014.10.08
申请人 Microsemi Storage Solutions (U.S.), Inc. 发明人 Chang Howard Shih Hao
分类号 H03B19/00;G01R27/26;G01R31/28;H03K5/14 主分类号 H03B19/00
代理机构 Letters Patent, LLC 代理人 Letters Patent, LLC ;Haszko Dennis R.
主权项 1. A monitoring system for monitoring the operation of an integrated circuit, the monitoring system comprising: a reference circuit comprising a first register and a first inverter coupled in a first feedback loop to provide a reference signal delay path having a first setup margin, and an output for outputting a reference signal; a monitoring circuit, the monitoring circuit comprising: a second register;a second inverter;a programmable delay line;wherein the second register, the programmable delay line, and the second inverter are coupled in a feedback loop to provide a controllably selectable delay path having a controllably selectable second setup margin; andan output for outputting a delayed signal; and a comparison circuit, for comparing the output reference signal to the output delayed signal and determining whether a time setup error has occurred based on the comparison.
地址 Aliso Viejo CA US