发明名称 Local self-boost using a plurality of cut-off cells on a single side of a string of memory cells
摘要 Methods for local self-boost of a selected memory cell channel, memory devices, and systems are disclosed. One such method generates a cut-off channel under each of a plurality of memory cells on one of either a source side or a drain side of a selected memory cell.
申请公布号 US9472287(B2) 申请公布日期 2016.10.18
申请号 US201414475828 申请日期 2014.09.03
申请人 Micron Technology, Inc. 发明人 Sakui Koji;Matsuyama Yasushi;Fisher Ryan G.
分类号 G11C16/04;G11C16/10;G11C16/34 主分类号 G11C16/04
代理机构 Dicke, Billig & Czaja, PLLC 代理人 Dicke, Billig & Czaja, PLLC
主权项 1. A method of operating a memory during a programming operation, comprising: biasing a control gate of a selected memory cell of a string of memory cells with a programming voltage sufficient to change a threshold voltage of a memory cell selected for programming during the programming operation; biasing a control gate of a first unselected memory cell of the string of memory cells with a voltage configured to turn off the first unselected memory cell; biasing a control gate of a second unselected memory cell of the string of memory cells with a voltage configured to turn off the second unselected memory cell; biasing control gates of at least one third unselected memory cell of the string of memory cells between the first unselected memory cell and the selected memory cell with voltages configured to turn on each third unselected memory cell; and biasing control gates of at least one fourth unselected memory cell of the string of memory cells between the first unselected memory cell and the second unselected memory cell with voltages configured to turn on each fourth unselected memory cell; wherein the first unselected memory cell is between a particular end of the string of memory cells and the selected memory cell; and wherein the second unselected memory cell is between the particular end of the string of memory cells and the first unselected memory cell.
地址 Boise ID US