发明名称 |
Input protection circuit for protecting an internal circuit of a semiconductor device from electrostatic discharge |
摘要 |
A circuit is provided for protecting the internal circuit of a semiconductor device from electrostatic discharge (ESD). This circuit includes an input pad for applying an input signal to the internal circuit, a metal line for electrically connecting the input pad and internal circuit. This metal line has at least one RC delay stage caused by inherent parasitic resistances and capacitances. Also, a punch-through element is provided to connect the metal line to a ground voltage terminal disposed between the input pad and a delay stage. Finally, a resistor is used to connect the at least one delay stage to the internal circuit.
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申请公布号 |
US5430602(A) |
申请公布日期 |
1995.07.04 |
申请号 |
US19930041224 |
申请日期 |
1993.03.31 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHIN, DAE-JE;CHOI, JONG-HYEON |
分类号 |
H01L27/06;H01L27/02;(IPC1-7):H02H3/20 |
主分类号 |
H01L27/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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