发明名称 Semiconductor device and method for manufacturing the same
摘要 In a semiconductor device and a method for manufacturing the same according to the present invention, for example, an insulating film is deposited on a silicon substrate, and a concave groove is formed in the insulating film in accordance with a predetermined wiring pattern. Titanium and palladium are deposited in sequence on the insulating film to form a titanium film and a palladium film, respectively. A silver film is formed on the palladium film by electroplating, and a groove-shaped silver wiring layer is formed by polishing. The resultant structure is annealed at a temperature of about 700 DEG C., and an intermetallic compound is formed by alloying the titanium film and palladium film with each other. Consequently, a burying type wiring layer whose resistance is lower than that of aluminum, is constituted by the silver wiring layer and intermetallic compound.
申请公布号 US5500559(A) 申请公布日期 1996.03.19
申请号 US19940249127 申请日期 1994.05.25
申请人 KABUSHIKI KAISHA TOSHIBA;EBARA CORPORATION 发明人 MIYATA, MASAHIRO;EZAWA, HIROKAZU;OGURE, NAOAKI;TSUJIMURA, MANABU;OHDAIRA, TAKEYUKI;INOUE, HIROAKI;IKEDA, YUKIO
分类号 H01L23/52;H01L21/3205;H01L21/768;H01L23/532;(IPC1-7):H01L31/06 主分类号 H01L23/52
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