发明名称 Method and apparatus for determining power supply wirings of a semiconductor device
摘要 An apparatus for determining power supply wirings of a semiconductor device includes a unit for executing a logic simulation based on both data concerning each of logic circuit blocks constituting the semiconductor device and data concerning signals for testing operations of the device, and thereby generating a respective output signal data for the logic circuit blocks, a unit for computing a respective operational frequency of the logic circuit blocks based on the generated output signal data, and a unit for computing a respective wiring width of each power supply line for supplying each of the logic circuit blocks with powers. The respective wiring width of each power supply line is determined based on the computed respective operational frequency of the logic circuit blocks and a plurality of wiring widths of respective power supply lines optimumly selected for each of a plurality of operational frequencies in advance. As a result, it is possible to ensure a reliable operation of each logic circuit block and simultaneously realize a reduction in the chip size.
申请公布号 US5502649(A) 申请公布日期 1996.03.26
申请号 US19950494146 申请日期 1995.06.23
申请人 FUJITSU LIMITED;FUJITSU VLSI LIMITED 发明人 HIRATA, YUKIO
分类号 H01L21/3205;G06F17/50;H01L21/82;H01L23/52;(IPC1-7):H01L21/66 主分类号 H01L21/3205
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