| 摘要 |
PROBLEM TO BE SOLVED: To calibrate the jitter or swing of a DUT(Device Under Test).SOLUTION: A system 100 for dynamically calibrating the operation parameter of a device under test (DUT) 130 includes: a signal generation device 110 for generating a test pattern; a DUT for generating a clock signal; and an oscilloscope 120 for comparing the margin of a generated clock signal with an eye diaphragm generated on an oscilloscope from a data pattern for measurement. A calibration unit 140 can generate a jitter value candidate for the signal generation device 110, and receives determination of whether or not the clock signal generated by the DUT 130 is within a predetermined resistance level by the data pattern generated by the jitter value candidate from the oscilloscope 120, and changes a jitter value in accordance with this. The calibration unit 140 may generate a voltage swing value.SELECTED DRAWING: Figure 1 |
