发明名称 Method of fabricating self-aligned FET structure having a high temperature stable T-shaped Schottky gate contact
摘要 A method of fabricating a self-aligned FET having a semi-insulating substrate of GaAs or InP with a conductive channel formed either by doping the surface or an epitaxially grown channel by molecular beam epitaxy or metalorganic vapor phase epitaxy in the substrate adjacent the surface. Forming a high temperature stable LaB6/TiWN "T-shaped" Schottky gate contact on the substrate surface, which is used for source and drain ohmic region implants into the substrate adjacent to the surface and self-aligned to the "T-shaped" gate, with source and drain ohmic contacts also self-aligned with respect to the gate.
申请公布号 US5550065(A) 申请公布日期 1996.08.27
申请号 US19940344911 申请日期 1994.11.25
申请人 MOTOROLA 发明人 HASHEMI, MAJID M.;TEHRANI, SAIED N.;NORTON, PATRICIA A.
分类号 H01L21/285;H01L21/338;H01L29/417;H01L29/423;H01L29/47;(IPC1-7):H01L21/265 主分类号 H01L21/285
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