发明名称 Exposure apparatus
摘要 An exposure apparatus includes a cleaning tool which is located at a position where it is brought into contact with the entire surface of a wafer holder when a wafer stage moves within a predetermined driving range, and a vertical driving shaft for biasing the cleaning tool against the wafer holder. While the cleaning tool is biased against the wafer holder, the wafer stage is moved within the predetermined driving range, thereby cleaning the wafer holder.
申请公布号 US5559582(A) 申请公布日期 1996.09.24
申请号 US19940283829 申请日期 1994.08.01
申请人 NIKON CORPORATION 发明人 NISHI, KENJI;AOYAMA, MASAAKI
分类号 G03F7/20;(IPC1-7):G03B27/52 主分类号 G03F7/20
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