发明名称 |
Scan based testing for analogue circuitry |
摘要 |
An integrated circuit containing analogue operation circuitry having a plurality of nodes for input and output of signals during normal operation, a plurality of scan cells connected to at least said plurality of nodes for containing signals to be utilized in selected tests to be performed on said analogue operation circuitry and responsive to selected output signals is provided. A method for testing a module of analogue circuitry incorporated into an integrated circuit having other circuitry by decoupling a plurality of module signal terminals from respective normal operation connections to a plurality of scan cells, and inputting at least portions of test suites and sensing test result output signals through at least selected ones of said scan cells is provided.
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申请公布号 |
US5577052(A) |
申请公布日期 |
1996.11.19 |
申请号 |
US19950476834 |
申请日期 |
1995.06.07 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
MORRIS, JOHN O. |
分类号 |
G01R31/316;G01R31/28;G01R31/3167;G01R31/3185;(IPC1-7):G06F15/20 |
主分类号 |
G01R31/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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