发明名称 PROCESS AND DEVICE FOR THE MEASURING OF A THREE-DIMENSIONAL SHAPE
摘要 The invention relates to a method and a device for the measuring of the shape of an object (1) to be measured, where the object to be measured has its surface supplied with fluorescent substances in the shape of a pattern (2; 10). The pattern is read by optical reading units (3; 4; 14, 15-19) by reading the same parts of the pattern from mutually different directions. The positions in space of the read-off parts of the pattern are calculated based on the measuring data for the reading units.
申请公布号 WO9714932(A1) 申请公布日期 1997.04.24
申请号 WO1996SE01329 申请日期 1996.10.18
申请人 OPTRONIC CONSULT AB;AAHLEN, HANS 发明人 AAHLEN, HANS
分类号 A61B1/00;A61B5/107;G01B11/25;(IPC1-7):G01B11/24 主分类号 A61B1/00
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