| 摘要 |
A device for measuring image quality properties of an image acquisition device while the subject or object is being scanned contains an embedded grid pattern to measure spatial distortion along the length of the image acquisition table. The device also contains reference materials, which may run along the length of the device, for measuring fundamental imaging properties such as signal strength, noise, and resolution. Automated software can detect the device within an acquisition, measure its properties, and provide data and reports on the quality of the image acquisition. |
