发明名称 GENERIC INTERFACE TEST ADAPTER
摘要 A generic interface test adapter for connecting between a test station and a unit under test. The generic interface test adapter includes an interface frame and an interchangeable circuit card assembly that are configured to route the signals between test station and the unit under test. The interface frame includes an interface plane having a plurality of contact pins or spring-loaded probes, and the circuit card assembly has a plurality of contact pads, aligned to mate with the contact pins. The electrical connections between the test station and the unit under test can be reconfigured merely by changing the interchangeable circuit card assembly. A pressure frame is provided to securely hold the circuit card assembly against the interface plane to provide electrical connection. The pressure frame is pulled toward the interface frame by a cam and angled cam slot mechanism operated by a lever arm.
申请公布号 WO9722886(A1) 申请公布日期 1997.06.26
申请号 WO1996US14949 申请日期 1996.09.18
申请人 LEAR ASTRONICS CORPORATION 发明人 OSTER, MELVIN, G.;FUCHS, BRIAN;REID, KENNETH
分类号 G01R31/28;(IPC1-7):G01R31/28 主分类号 G01R31/28
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