发明名称 |
SUBSTRAT ET PROCEDE DE FABRICATION D'UN SUBSTRAT |
摘要 |
A substrate (1) for producing transistors having fully depleted channels, with the substrate comprising the following stacking: - a support (6) comprising contaminant species liable to diffuse; - a barrier layer for encapsulating (5) the support and able to prevent the diffusion of the contaminant species; - an intermediate layer (4) made of a polycrystalline or amorphous semiconductor material on the encapsulation barrier layer (5); - an electrically insulating layer (3) having a thickness ranging from 2 to 50 nanometers on the intermediate layer ( 4 ); - a semiconductive upper layer (2) having a thickness ranging from 2 to 50 nanometers on the electrically insulating layer (3) and free of contaminant species. |
申请公布号 |
FR3027451(B1) |
申请公布日期 |
2016.11.04 |
申请号 |
FR20140060110 |
申请日期 |
2014.10.21 |
申请人 |
SOITEC |
发明人 |
RADU IONUT;KONONCHUK OLEG;MAZURE CARLOS;DELPRAT DANIEL |
分类号 |
H01L27/12;H01L21/30;H01L21/8232 |
主分类号 |
H01L27/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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