IC TESTING DEVICE,申请号JP19960061694-传众专利搜索

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发明名称	IC TESTING DEVICE
摘要
申请公布号	JPH09230004(A)	申请公布日期	1997.09.05
申请号	JP19960061694	申请日期	1996.02.23
申请人	HITACHI ELECTRON ENG CO LTD	发明人	MOTOKI NOBUO
分类号	G01R31/28;G11C29/00;G11C29/56;(IPC1-7):G01R31/28	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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