发明名称 Semiconductor device with first and second sealing resins
摘要 It is an object to increase a breakdown voltage of a lead frame. A primary sealing resin (41) seals the upper main surface of a lead frame (3) and elements mounted thereon. A secondary sealing resin (21) coupling the lead frame (3) and a heat sink (51) passes through gaps of the lead frame (3) having pattern configuration to project on the upper main surface side of the lead frame (3). The primary sealing resin (41) is in close contact with the projections (62). The projections (62) enlarge the creeping distance along the interface between the primary sealing resin (41) and the secondary sealing resin (21) between parts of the lead frame (3) adjacent with gaps therebetween, so that the breakdown voltage between those parts is increased.
申请公布号 US5698899(A) 申请公布日期 1997.12.16
申请号 US19960666946 申请日期 1996.06.20
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 HIRAKAWA, SATOSHI;TAKAO, HARUO
分类号 H01L23/29;H01L21/56;H01L23/31;H01L23/36;H01L23/433;H01L23/495;H01L25/07;H01L25/18;(IPC1-7):H01L23/02 主分类号 H01L23/29
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