发明名称 |
Method of measuring surface reflectance and a method of producing antireflective polarizing film |
摘要 |
A method of measuring surface reflectance of a polarizing film product and for producing an antireflective polarizing film. The method includes placing a linear polarizer between a polarizing film product and a light supplying part, and measuring light reflected by the surface of the film.
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申请公布号 |
US5812264(A) |
申请公布日期 |
1998.09.22 |
申请号 |
US19950558608 |
申请日期 |
1995.10.31 |
申请人 |
SUMITOMO CHEMICAL COMPANY, LIMITED |
发明人 |
NAKAMURA, KIMISHIGE;ISHIDA, HIROSHI;OHSAKI, AKIO |
分类号 |
G01N21/21;G02B5/30;(IPC1-7):G01J4/00;G01J3/28 |
主分类号 |
G01N21/21 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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