发明名称 Method of measuring surface reflectance and a method of producing antireflective polarizing film
摘要 A method of measuring surface reflectance of a polarizing film product and for producing an antireflective polarizing film. The method includes placing a linear polarizer between a polarizing film product and a light supplying part, and measuring light reflected by the surface of the film.
申请公布号 US5812264(A) 申请公布日期 1998.09.22
申请号 US19950558608 申请日期 1995.10.31
申请人 SUMITOMO CHEMICAL COMPANY, LIMITED 发明人 NAKAMURA, KIMISHIGE;ISHIDA, HIROSHI;OHSAKI, AKIO
分类号 G01N21/21;G02B5/30;(IPC1-7):G01J4/00;G01J3/28 主分类号 G01N21/21
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