Loaded board test fixture with integral translator fixture for testing closely spaced test sites

摘要

A test fixture for testing a loaded printed circuit board having a plurality of test points includes a housing and a probe plate located in the base of the housing. The probe plate includes an array of widely spaced high spring force test probes in compliant contact with solid translator pins located in a translator fixture removably positioned over the probe plate. The translator fixture is positioned within a cavity in the housing adjacent the test points on the printed circuit board. The translator fixture includes a top plate having recessed portions for receipt of loaded circuit board components so that the top plate is adjacent the test points on the circuit board. The translator fixture aligns the translator pins to translate electrical test signals between the test points and an external electronic test analyzer electrically connected to the test probes. The translator pins can be adapted to rotate on their axes when applying such test forces by use of twisting test probes in an alternative embodiment.