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发明名称
CONNECTOR AND SEMICONDUCTOR INSPECTION DEVICE
摘要
申请公布号
JPH1182450(A)
申请公布日期
1999.03.26
申请号
JP19970244122
申请日期
1997.09.09
申请人
ASAHI KASEI MICRO SYST KK
发明人
SATO HIDEMICHI
分类号
G01R31/26;F16B21/02;(IPC1-7):F16B21/02
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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