首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
THE CONTINUOUS MANUFACTURING PROCESS FROM POLYTETRAFLUOROETHYLENE TO TETRAFLUOROETHYLENE
摘要
申请公布号
KR100177870(B1)
申请公布日期
1999.05.15
申请号
KR19950029586
申请日期
1995.09.11
申请人
HANWHA CHEMICAL CORPORATION
发明人
CHO, JOO-HWAN;MYUNG, WAN-JAE;HAN, JUNG-WOO;PARK, CHANG-HEE1;SHIN, HO-CHUL;LEE, KWANG-HYUN;YEUN, DAE-ILL
分类号
C07C19/08;(IPC1-7):C07C19/08
主分类号
C07C19/08
代理机构
代理人
主权项
地址
您可能感兴趣的专利
SCIENTIFIC CASTING METHOD AND APPARATUS
Luminaire Utilizing Waveguide
NEAR-INFRARED CUT FILTER
BIRD ANTI-COLLISION WINDOW FILM
GRID CELL PINCHOUT FOR RESERVOIR SIMULATION
SEISMIC DATA ACQUISITION WITH VARYING RELATIVE DISTANCE BETWEEN MULTIPLE SEISMIC VESSELS
REFERENCE CALIBRATION IN PHOTON COUNTING BASED SPECTRAL CT
MODULAR HIGH RESOLUTION X-RAY COMPUTED TOMOGRAPHY SYSTEM
Radiation Detector including an External-Modulated Electro-optical Coupling Detector Architecture for Nuclear Physics Instrumentation
USING A TWO-DIMENSIONAL SCANNER TO SPEED REGISTRATION OF THREE-DIMENSIONAL SCAN DATA
SYNTHETIC APERTURE RADAR SYSTEM
Method and System for B0 Drift and Respiratory Motion Compensation in Echo-Planar Based Magnetic Resonance Imaging
METHOD OF TESTING A DIMMING LIGHTING SYSTEM
STRAIN MEASUREMENT BASED BATTERY TESTING
CELL STATE CALCULATION APPARATUS AND CELL STATE CALCULATION METHOD
ATOM PROBE TOMOGRAPHY SAMPLE PREPARATION FOR THREE-DIMENSIONAL (3D) SEMICONDUCTOR DEVICES
QUANTITATIVE CHARACTERIZATION OF NONLINEARITY AND MEMORY EFFECT IN NONLINEAR CIRCUITS
Probe System designed for Probing of Electronic Parts Mounted into Application or Test Boards
Automatic Analysis Apparatus and Sample Measuring Method
Freeze-Dried Conjugate Structure for Point-of-Care Testing (POCT) Immunochromatography, Immunoassay Kit Comprising the Same, and Method for Analysis Using the Kit
