发明名称 |
Method of making floating gate based memory device |
摘要 |
Semiconductor memory device and method is provided for a stacked gate type flash semiconductor memory device. The semiconductor memory device improves programming and erasing operation efficiency. A gate oxide layer and a floating gate are formed to be stacked on a substrate. A first dielectric layer and a control gate are formed to be stacked on the floating gate. A second dielectric layer is formed on both sides of the floating gate and first and second semiconductor sidewalls are formed on the second dielectric layer on the both sides of the floating gate. Impurity regions are formed in the substrate at the both sides of the floating gate and a wire layer is formed to contact with the semiconductor sidewalls and each of the impurity regions.
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申请公布号 |
US5915176(A) |
申请公布日期 |
1999.06.22 |
申请号 |
US19970929111 |
申请日期 |
1997.09.15 |
申请人 |
LG SEMICON CO., LTD. |
发明人 |
LIM, MIN-GYU |
分类号 |
H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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