发明名称 MEMORY STRUCUTRE WITH SELF-ALIGNED FLOATING AND CONTROL GATES AND ASSOCIATED METHODS
摘要 A memory structure having at least substantially aligned floating and control gates. Such a memory structure can include a control gate material disposed between a first insulator layer and a second insulator layer, a floating gate material disposed between the first insulator layer and the second insulator layer and at least substantially aligned with the control gate material, the floating gate material including a metal region, and an interpoly dielectric (IPD) layer disposed between the control gate material and the floating gate material such that the IPD layer electrically isolates the control gate material from the floating gate material.
申请公布号 EP3087605(A1) 申请公布日期 2016.11.02
申请号 EP20140875254 申请日期 2014.11.24
申请人 INTEL CORPORATION 发明人 HOPKINS, JOHN D.;SIMSEK-EGE, FATMA A.
分类号 H01L27/115;H01L21/8247;H01L29/788 主分类号 H01L27/115
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