发明名称 ELASTIC WAVE DEVICE
摘要 An elastic wave device includes an IDT electrode provided on a main surface of a LiTaO3 substrate, and uses plate waves in an SH0 mode, which is a basic mode of SH waves. A wavelength-normalized thickness of the LiTaO3 substrate normalized by a wavelength determined by a pitch of electrode fingers of the IDT electrode, and an Al equivalent wavelength-normalized thickness of the IDT electrode satisfy any one of combinations listed in the following table:;(a)The wavelength-normalized thickness is about 0.01 ormore and about 0.30 or less, and the wavelength-normalized thickness of Al is about 0.04 or more andabout 0.1 or less.(b)The wavelength-normalized thickness is about 0.01 ormore and about 0.70 or less, and the wavelength-normalized thickness of Al is about 0.04 or more andabout 0.08 or less.
申请公布号 US2016352305(A1) 申请公布日期 2016.12.01
申请号 US201615236594 申请日期 2016.08.15
申请人 Murata Manufacturing Co., Ltd. 发明人 KIMURA Tetsuya
分类号 H03H9/145;H03H9/02 主分类号 H03H9/145
代理机构 代理人
主权项 1. An elastic wave device comprising: a LiTaO3 substrate; and an IDT electrode provided on a main surface of the LiTaO3 substrate and made of Al or predominantly made of Al; wherein the elastic wave device uses a plate wave in an SH0 mode that is a basic mode of SH waves; and a wavelength-normalized thickness of the LiTaO3 substrate that is a thickness of the LiTaO3 substrate normalized by a wavelength determined by a pitch of electrode fingers of the IDT electrode and an Al equivalent wavelength-normalized thickness of the IDT electrode satisfy any one of combinations listed in Table 1:TABLE 1(a)The wavelength-normalized thickness is about 0.01 ormore and about 0.30 or less, and the wavelength-normalized thickness of Al is about 0.04 or more andabout 0.1 or less.(b)The wavelength-normalized thickness is about 0.01 ormore and about 0.70 or less, and the wavelength-normalized thickness of Al is about 0.04 or more andabout 0.08 or less.
地址 Nagaokakyo-shi JP