发明名称 |
Method for manufacturing semiconductor device |
摘要 |
A method for manufacturing a semiconductor device includes the steps of: forming a laminated film by forming an aluminum film and a titanium film in this order on P-type and N-type electrically conductive regions of a silicon substrate and forming a silicide layer containing a titanium silicide as a major component on the electrically conductive region by allowing the laminated film to react with silicon constituting the silicon substrate by a first heat treatment.
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申请公布号 |
US5989996(A) |
申请公布日期 |
1999.11.23 |
申请号 |
US19980022009 |
申请日期 |
1998.02.11 |
申请人 |
SHARP KABUSHIKI KAISHA |
发明人 |
KISHI, AKIRA |
分类号 |
H01L21/28;H01L21/285;H01L21/336;H01L21/8238;H01L29/78;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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