发明名称 Method for manufacturing semiconductor device
摘要 A method for manufacturing a semiconductor device includes the steps of: forming a laminated film by forming an aluminum film and a titanium film in this order on P-type and N-type electrically conductive regions of a silicon substrate and forming a silicide layer containing a titanium silicide as a major component on the electrically conductive region by allowing the laminated film to react with silicon constituting the silicon substrate by a first heat treatment.
申请公布号 US5989996(A) 申请公布日期 1999.11.23
申请号 US19980022009 申请日期 1998.02.11
申请人 SHARP KABUSHIKI KAISHA 发明人 KISHI, AKIRA
分类号 H01L21/28;H01L21/285;H01L21/336;H01L21/8238;H01L29/78;(IPC1-7):H01L21/28 主分类号 H01L21/28
代理机构 代理人
主权项
地址