发明名称 |
SEMICONDUCTOR DEVICE, MANUFACTURING METHOD OF THE SAME, OR DISPLAY DEVICE INCLUDING THE SAME |
摘要 |
To suppress a change in electrical characteristics and improve reliability in a transistor. The transistor includes a first gate electrode, a first insulating film over the first gate electrode, a second insulating film over the first insulating film, an oxide semiconductor film over the second insulating film, a source electrode electrically connected to the oxide semiconductor film, a drain electrode electrically connected to the oxide semiconductor film, a third insulating film over the oxide semiconductor film, a fourth insulating film over the third insulating film, a second gate electrode over the fourth insulating film, and a fifth insulating film over the second gate electrode. One or more of the second insulating film, the third insulating film, and the fourth insulating film include a halogen element. The halogen element is detected from one or more of a top surface, a bottom surface, and a side surface of the oxide semiconductor film. |
申请公布号 |
US2016351720(A1) |
申请公布日期 |
2016.12.01 |
申请号 |
US201615159032 |
申请日期 |
2016.05.19 |
申请人 |
Semiconductor Energy Laboratory Co., Ltd. |
发明人 |
YAMAZAKI Shunpei;NAKAYAMA Tomonori;NAKASHIMA Motoki;HIRAMATSU Tomoki |
分类号 |
H01L29/786;H01L29/04;H01L27/12;H01L27/32;G02F1/1341;G02F1/1343;G02F1/1362;G02F1/133;G02F1/1368;G02F1/1337;H01L29/24;H01L29/66 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a transistor comprising:
a first gate electrode;a first insulating film over the first gate electrode;a second insulating film over the first insulating film;an oxide semiconductor film over the second insulating film;a source electrode electrically connected to the oxide semiconductor film;a drain electrode electrically connected to the oxide semiconductor film;a third insulating film over the oxide semiconductor film;a fourth insulating film over the third insulating film;a second gate electrode over the fourth insulating film; anda fifth insulating film over the second gate electrode, wherein one or more of the second insulating film, the third insulating film, and the fourth insulating film include a halogen element, and wherein the halogen element is detected from one or more of a top surface, a bottom surface, and a side surface of the oxide semiconductor film. |
地址 |
Atsugi-shi JP |