发明名称 COBALT ETCH BACK
摘要 PROBLEM TO BE SOLVED: To provide methods of selectively etching cobalt on substrates.SOLUTION: A method involves exposing a substrate to a boron-containing halide gas and an additive, and exposing the substrate to an activation gas and plasma. Additives improve selectively depositing a thicker layer of a boron-containing halide material on a surface of a mask than on a surface of a metal. The additives include H, CH, CF, NFand Cl. The boron-containing halide gases include BCl, BBr, BF, and BI. Exposures of them may be performed in two or more cycles, with variations in duration and/or bias power for each exposure in the two or more cycles.SELECTED DRAWING: Figure 1
申请公布号 JP2016208027(A) 申请公布日期 2016.12.08
申请号 JP20160082061 申请日期 2016.04.15
申请人 LAM RESEARCH CORPORATION 发明人 YANG JIA-LING;ZHOU BAOSUO;MEIHUA SHEN;THORSTEN LILL;JOHN HOANG
分类号 H01L21/3065;C23F4/00;H01L21/28;H01L21/3213;H01L21/768 主分类号 H01L21/3065
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