| 摘要 |
<p>The instrument has UV-NIR spectrophotometer (102) and FTIR spectrometer (150) that are focussed towards two mutually different areas of sample (120) that are overlapping with each other. Two beam directing elements are mounted on a common turret (116) for directing a beam to the spectrophotometer (102) and to a spectrometer. The beam directing element used with the spectrophotometer consists of the objective lenses (110,112,114) while the beam directing element used with the spectrometer consists of a mirror (156). The linear turret (116) is movable, so that either the objective lens (114) or the mirror (156) is aligned with the vertical axis (104) of a sample (120). The sample (120) is mounted on a stage (122) that is controlled by a microprocessor (132), so that a desired measurement area on the sample (120) is positioned under the vertical axis (104). A camera (134) is provided to measure a desired feature on the sample. Inert gas is supplied into purging shroud (172) to purge any atmospheric gases present in the optical path of the spectrometer to eliminate its influence on measurement. An independent claim is also included for surface characteristic measurement method of sample.</p> |
