发明名称 CONTROL SYSTEM OF A SEMICONDUCTOR FABRICATION EQUIPMENT
摘要 PURPOSE: A control system of a semiconductor fabrication equipment is provided to improve an equipment management by installing a separate interlock sensor which receives an input/output parameter from a central processing unit and an auxiliary central processing unit. CONSTITUTION: The control system of a semiconductor fabrication equipment comprises: an operator(20) for applying various control signals for a semiconductor diffusion process; a central processing unit(22) for storing a control signal from the operator to apply the received signal to an auxiliary equipment; an auxiliary central processing unit(24) connected to the central processing unit, for performing an auxiliary role; a load unit(26) operative in response to the signal from the auxiliary central processing unit; a comparison interlock sensor(28) for comparing the signal applied to the central processing unit, the auxiliary central processing unit and the load unit with a signal transferred up to the load unit, and for sensing an abnormal signal generation; a parameter input unit(30) for applying an external utility to the auxiliary central processing unit; and an input parameter sensor(32) for comparing the signal supplied from the input parameter to sense whether or not an abnormal signal is generated.
申请公布号 KR20000001704(A) 申请公布日期 2000.01.15
申请号 KR19980022080 申请日期 1998.06.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 RYU, KYU BOK
分类号 H01L21/22;(IPC1-7):H01L21/22 主分类号 H01L21/22
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