发明名称 |
CONTROL SYSTEM OF A SEMICONDUCTOR FABRICATION EQUIPMENT |
摘要 |
PURPOSE: A control system of a semiconductor fabrication equipment is provided to improve an equipment management by installing a separate interlock sensor which receives an input/output parameter from a central processing unit and an auxiliary central processing unit. CONSTITUTION: The control system of a semiconductor fabrication equipment comprises: an operator(20) for applying various control signals for a semiconductor diffusion process; a central processing unit(22) for storing a control signal from the operator to apply the received signal to an auxiliary equipment; an auxiliary central processing unit(24) connected to the central processing unit, for performing an auxiliary role; a load unit(26) operative in response to the signal from the auxiliary central processing unit; a comparison interlock sensor(28) for comparing the signal applied to the central processing unit, the auxiliary central processing unit and the load unit with a signal transferred up to the load unit, and for sensing an abnormal signal generation; a parameter input unit(30) for applying an external utility to the auxiliary central processing unit; and an input parameter sensor(32) for comparing the signal supplied from the input parameter to sense whether or not an abnormal signal is generated.
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申请公布号 |
KR20000001704(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980022080 |
申请日期 |
1998.06.12 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
RYU, KYU BOK |
分类号 |
H01L21/22;(IPC1-7):H01L21/22 |
主分类号 |
H01L21/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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