发明名称 DEVICE FOR MEASURING LENS ABERRATION AND METHOD FOR MEASURING ABERRATION USING THE MEASURING DEVICE
摘要 PURPOSE: A device for measuring a lens aberration is provided to enable to use a complete spherical surface wave as a standard optical source and to measure the aberration down to the third decimal place of a wavelength. CONSTITUTION: A device for measuring a lens aberration comprises: a testing lens(40); a first diffractive optics device(42a) installed in front of the testing lens; a condenser lens(42b) installed in front of the first diffractive optics device; an aperture(42c) installed in front of the condenser lens for limiting the incident optical amount to the condenser lens; a second diffractive optics device(44a) installed behind the testing lens; and an optical measuring instrument(44b) installed behind the second diffractive optics device.
申请公布号 KR20000001480(A) 申请公布日期 2000.01.15
申请号 KR19980021762 申请日期 1998.06.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KYE, JONG WOOK
分类号 G02B27/44;(IPC1-7):G02B27/44 主分类号 G02B27/44
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