发明名称 |
DEVICE FOR MEASURING LENS ABERRATION AND METHOD FOR MEASURING ABERRATION USING THE MEASURING DEVICE |
摘要 |
PURPOSE: A device for measuring a lens aberration is provided to enable to use a complete spherical surface wave as a standard optical source and to measure the aberration down to the third decimal place of a wavelength. CONSTITUTION: A device for measuring a lens aberration comprises: a testing lens(40); a first diffractive optics device(42a) installed in front of the testing lens; a condenser lens(42b) installed in front of the first diffractive optics device; an aperture(42c) installed in front of the condenser lens for limiting the incident optical amount to the condenser lens; a second diffractive optics device(44a) installed behind the testing lens; and an optical measuring instrument(44b) installed behind the second diffractive optics device.
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申请公布号 |
KR20000001480(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980021762 |
申请日期 |
1998.06.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KYE, JONG WOOK |
分类号 |
G02B27/44;(IPC1-7):G02B27/44 |
主分类号 |
G02B27/44 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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