| 摘要 |
PROBLEM TO BE SOLVED: To obtain a management device for an IC test device, where an application program without connection to an IC test device and a control device can be used and development and debugging are easily done. SOLUTION: A control register 31 essentially contained in an IC test device in which a control result that a control program 64 imitates an operation of the IC test device to obtain is stored. The control program 64 has the same function as a control program built in the control device and also a function imitating so as to obtain a same control result as a result in a case where the IC test device and the control device are connected in accordance with a control demand C1, and then outputs the control result as a control result notice C2. An application program 61 receives data D1 including a control command from an input device 10 to create a control demand P1, and sends data 3 from a control result notice P2 to an output device 20 to display the control result. A management program 63 converts data forms between the control demands C1 and P1 and between the control result notices C2 and P2.
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