发明名称 PROBE DEVICE
摘要 <p>A probe apparatus 10 comprises a probe card 13, a main chuck 12, an X-stage 14 and a Y-stage 15. A vertical drive mechanism 18 is provided such that an extension line from a center for inspection of the probe card 13 coincides with an axis of the vertical drive mechanism. A static-pressure thrust air bearing 19, which is coaxial with the vertical drive mechanism 18 and vertically drives a main chuck 12, is provided as a vertically movable member. A gap-maintaining means 23 is provided to maintain a gap at a constant size between the static thrust air bearing 19 and the main chuck 12. &lt;IMAGE&gt;</p>
申请公布号 EP0993035(A1) 申请公布日期 2000.04.12
申请号 EP19990910804 申请日期 1999.04.01
申请人 TOKYO ELECTRON LIMITED 发明人 KUJI, MOTOHIRO;AKAIKE, YUTAKA
分类号 G01R1/06;H01L21/66;B23Q1/38;B23Q1/40;G01R1/10;G01R1/14;G01R31/28;H01L21/68;(IPC1-7):H01L21/66 主分类号 G01R1/06
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