发明名称 INSPECTION DEVICE OF LAMP FOR WAFER INSPECTION APPARATUS
摘要 PURPOSE: An apparatus for directing the status of a lamp in wafer inspection equipment is provided to reduce the inspection error by detecting the voltage of a sensor to determine the changing time of the lamp. CONSTITUTION: A display unit(10) comprises an amplifier(12) amplifying the signal sensed by sensor, transistors(Q1¯Q9) connected with the amplifier via resistors(R10¯R18), and diodes(D1¯D8) connected between the resistors(R10¯R18) respectively. A plurality of light emission diodes(LED1¯LED9) connects to a voltage source(Vs), and connects to each collector of the transistor( Q1¯Q9). According to the signal amplified by the amplifier(12), it is determined whether the transistors(Q1¯Q9) are on or off. The light emission diodes(LED1¯LED9) are on or off in response to the operation of the transistors(Q1¯Q9). The light emission diodes(LED1¯LED9) emit light to display the voltage level sensed by sensor.
申请公布号 KR100251648(B1) 申请公布日期 2000.04.15
申请号 KR19970013315 申请日期 1997.04.10
申请人 SAMSUNG ELECTRONICS CO, LTD. 发明人 KIM, JIN MUK
分类号 H01L21/66;(IPC1-7):H01L21/66 主分类号 H01L21/66
代理机构 代理人
主权项
地址